Inactivation and injury of Escherichia coli O157:H7 and Staphylococcus aureus by pulsed electric fields

被引:25
作者
Damar, S [1 ]
Bozoglu, F [1 ]
Hizal, M [1 ]
Bayindirli, A [1 ]
机构
[1] Middle E Tech Univ, Dept Food Engn, TR-06531 Ankara, Turkey
关键词
electric field strength; E. coli O157 : H7; inactivation; injury; modelling; pathogens; pulse number; pulsed electric field; S; aureus;
D O I
10.1023/A:1013900222139
中图分类号
Q81 [生物工程学(生物技术)]; Q93 [微生物学];
学科分类号
071005 ; 0836 ; 090102 ; 100705 ;
摘要
Two pathogenic microorganisms Escherichia coli O157:H7 and Staphylococcus aureus, suspended in peptone solution (0.1% w/v) were treated with 12, 14, 16 and 20 kV/cm electric field strengths with different pulse numbers up to 60 pulses. Pulsed electric field (PEF) treatment at 20 kV/cm with 60 pulses provided nearly 2 log reduction in viable cell counts of E. coli O157:H7 and S. aureus. S. aureus cells were slightly more resistant than E.coli O157:H7 cells. The results related to the effect of initial cell concentration of E. coli O157:H7 on the PEF inactivation showed that more inactivation was obtained by decreasing initial cell concentration. Any possible injury by PEF was also investigated after applying 20 kV/cm electric field to the microorganisms. As a result, it was determined that there was 35.92 to 43.36% injury in E. coli O157:H7 cells, and 17.26 to 30.86% injury in S. aureus cells depending on pulse number. The inactivation results were also described by a kinetic model.
引用
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页码:1 / 6
页数:6
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