High-speed fringe analysis method using frequency demodulation technology

被引:4
作者
Arai, Y
Yokozeki, S
Shiraki, K
Yamada, T
机构
[1] KYUSHU INST TECHNOL, FAC COMP SCI & SYST ENGN, DEPT MECH SYST ENGN, IIZUKA, FUKUOKA, JAPAN
[2] KANSAI UNIV, FAC ENGN, DEPT MECH SYST ENGN, SUITA, OSAKA 564, JAPAN
关键词
fringe analysis; frequency demodulation; interferometer;
D O I
10.1117/1.600821
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Interferometer fringe-pattern analysis using the fast Fourier transform (FFT) technology is a very precise measuring method. However, this method has not received significant attention in industry, as a result of the long calculation time for an operation, because the method processes an image using sophisticated algorithms. In this work, in order to reduce the calculation time, the fringes imaged on CCD sensor are processed as analog data in the time domain. The fringes are spatial information on a CCD sensor, and can be converted to a synchronous electrical signal by the CCD driving clock pulse at the terminal of CCD output. In the new method, the analog electrical signal, which corresponds to the fringes on the CCD sensor, is analyzed using an electrical circuit in the time domain. The time-instantaneous frequency and phase of the fringes are detected by frequency-demodulating and integrating the signal, respectively. This proposed system can perform high speed fringe analysis operations in 10 ms per raster line of the CCD. The experimental results show that the new fringe analysis has very high speed and is as accurate as the FFT method. (C) 1996 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码:2341 / 2344
页数:4
相关论文
共 6 条
  • [1] DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES
    BRUNING, JH
    HERRIOTT, DR
    GALLAGHER, JE
    ROSENFELD, DP
    WHITE, AD
    BRANGACCIO, DJ
    [J]. APPLIED OPTICS, 1974, 13 (11) : 2693 - 2703
  • [2] CLARKE KK, 1971, COMMUNICATION CIRCUI, P509
  • [3] DIRECT PHASE DETECTING SYSTEM
    ICHIOKA, Y
    INUIYA, M
    [J]. APPLIED OPTICS, 1972, 11 (07): : 1507 - &
  • [4] KUJAWINSKA M, 1990, AUTOMATIC FRINGE PAT
  • [5] Malacara D., 1992, Optical Shop Testing, P501
  • [6] FOURIER-TRANSFORM METHOD OF FRINGE-PATTERN ANALYSIS FOR COMPUTER-BASED TOPOGRAPHY AND INTERFEROMETRY
    TAKEDA, M
    INA, H
    KOBAYASHI, S
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (01) : 156 - 160