Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms

被引：80

作者：

Hwu, Y ^{[1
]}

Hsieh, HH

Lu, MJ

Tsai, WL

Lin, HM

Goh, WC

Lai, B

Je, JH

Kim, CK

Noh, DY

Youn, HS

Tromba, G

Margaritondo, G

机构：

[1] Acad Sinica, Inst Phys, Taipei 11529, Taiwan

[2] Tatung Inst Technol, Dept Mat Sci, Taipei 104, Taiwan

[3] Natl Univ Singapore, Dept Mat Sci, Singapore 119260, Singapore

[4] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[5] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea

[6] Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 506712, South Korea

[7] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea

[8] Sincrotrone Trieste, I-34012 Trieste, Italy

[9] Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland

来源：

JOURNAL OF APPLIED PHYSICS | 1999年 / 86卷 / 08期

关键词：

D O I：

10.1063/1.371411

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Tests performed in different regimes reveal the interplay of two edge-enhancement mechanisms in radiological images taken with coherent synchrotron light. The relative weight of the two mechanisms, related to refraction and to Fresnel edge diffraction, can be changed in a controlled way. This makes it possible to obtain different images of the same object with complementary information. (C) 1999 American Institute of Physics. [S0021-8979(99)03720-2].

引用

页码：4613 / 4618

页数：6

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