Crystallization behaviors and microhardness of sputtered Ni-P, Ni-P-Cr and Ni-P-W deposits on tool steel

被引:26
作者
Chen, WY [1 ]
Tien, SK [1 ]
Wu, FB [1 ]
Duh, JG [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu, Taiwan
关键词
RF sputter; Ni-P-based deposit; thermal stability; strengthening mechanism; differential thermal analysis; microhardness;
D O I
10.1016/S0257-8972(03)00851-X
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The Ni-P-based coatings, including binary Ni-P, ternary Ni-P-Cr and Ni-P-W, were fabricated by the RF magnetron sputtering technique with dual target of electroless Ni-P alloy and a third metal element. To evaluate the influence of the doping element in Ni-P deposit, differential scanning calorimeter (DSC) analysis was employed to characterize the temperature of phase transformation. The phase transition during thermal evolution under heat-treatment was analyzed by X-ray diffractometry (XRD). Crystallization behavior in binary and ternary Ni-P-based coatings was quite distinct due to the addition of Cr and W. Microhardness tests indicated that the sputtered Ni-P-Cr and Ni-P-W coatings exhibited superior hardness and excellent thermal stability than the Ni-P coating. In addition, chromium exhibited compatible thermal characteristics with the tungsten for the ternary Ni-P-based system. The strengthening mechanism in the sputtered Ni-P-Cr and Ni-P-W deposits is also discussed. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:85 / 91
页数:7
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