Reconfigurable Monitoring System for Time-Frequency Analysis on Industrial Equipment Through STFT and DWT

被引：156

作者：

Cabal-Yepez, Eduardo ^{[1
]}

Garcia-Ramirez, Armando G. ^{[1
]}

Romero-Troncoso, Rene J. ^{[1
]}

Garcia-Perez, Arturo ^{[1
]}

Osornio-Rios, Roque A. ^{[2
]}

机构：

[1] Univ Guanajuato, HSPdigital, CA Telemat Procesamiento Digital Sen, Div Ingenierias, Salamanca 36700, Spain

[2] Univ Autonoma Queretaro, Fac Ingn, HSPdigital, CA Mecatron, San Juan Del Rio 76807, Queretaro, Spain

来源：

IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS | 2013年 / 9卷 / 02期

关键词：

Discrete wavelet transform (DWT); field programmable gate arrays (FPGAs); short-time Fourier transform (STFT); system monitoring; system-on-chip (SoC); time-frequency analysis; FUSED SMART-SENSOR; WAVELET TRANSFORM; FAULT-DIAGNOSIS; INDUCTION-MOTOR; IMPLEMENTATION; ALGORITHM; DESIGN; TOOL;

D O I：

10.1109/TII.2012.2221131

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

080201 [机械制造及其自动化];

摘要：

Nowadays industry pays much attention to prevent failures that may interrupt production with severe consequences in cost, product quality, and safety. The most-analyzed parameters for monitoring dynamic characteristics and ensuring correct functioning of systems are electric current, voltage, and vibrations. System-on-chip (SoC) design is an approach to increase performance and overcome costs during equipment monitoring. This work presents the design and implementation of a low-cost SoC design that utilizes reconfigurable hardware and a customized embedded processor for time-frequency analysis on industrial equipment through short-time Fourier transform and discrete wavelet transform. Three study cases (electric current supply to an induction motor during startup transient, voltage supply to an induction motor through a variable speed drive, and vibration signals from industrial-robot links) show the suitability of the proposed monitoring system for time-frequency analysis of different signals in distinct industrial applications, and early diagnosis and prognosis of abnormalities in monitored systems.

引用

页码：760 / 771

页数：12

共 48 条

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