Experimental study of surface-plasmon scattering by individual surface defects

被引:93
作者
Smolyaninov, II [1 ]
Mazzoni, DL [1 ]
Mait, J [1 ]
Davis, CC [1 ]
机构
[1] USA, RES LAB, AMSRL SE EO, ADELPHI, MD 20783 USA
来源
PHYSICAL REVIEW B | 1997年 / 56卷 / 03期
关键词
D O I
10.1103/PhysRevB.56.1601
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A direct-write ablation technique has been implemented in a photon scanning tunneling microscope setup. This combination allows us to study surface-plasmon (SP) scattering by in situ created individual surface defects, while the sizes and shapes of the defects are Varied continuously. It is found that within a certain range of its size, a ''hill'' on an otherwise flat surface can be the source of a very narrow plasmon beam. This effect is explained using the Huygens-Fresnel principle. Shadowing and refraction of the SP field by smaller defects has also been observed. In order to explain these results we introduce an effective SP refractive index for two classes of surface defects: shallow topographical defects and areas covered with absorbed molecular layers. This concept allows us to achieve a qualitative understanding of plasmon scattering in many practical cases. Some simple optical elements for the control of SP propagation are suggested and demonstrated. Our observations suggest numerous practical applications in multichannel chemical sensing, biosensing, and integrated optics.
引用
收藏
页码:1601 / 1611
页数:11
相关论文
共 31 条
[1]  
ABELES F, 1982, SURFACE POLARITONS, P252
[2]   DETERMINATION OF THE SPATIAL EXTENSION OF THE SURFACE-PLASMON EVANESCENT FIELD OF A SILVER FILM WITH A PHOTON SCANNING TUNNELING MICROSCOPE [J].
ADAMS, PM ;
SALOMON, L ;
DEFORNEL, F ;
GOUDONNET, JP .
PHYSICAL REVIEW B, 1993, 48 (04) :2680-2683
[3]  
Agranovich V.M., 1982, Surface Polaritons
[4]  
AGRANOVICH VM, 1979, ZH EKSP TEOR FIZ, V50, P567
[5]   NEAR-FIELD MICROSCOPY OF SURFACE-PLASMON POLARITONS - LOCALIZATION AND INTERNAL INTERFACE IMAGING [J].
BOZHEVOLNYI, SI ;
SMOLYANINOV, II ;
ZAYATS, AV .
PHYSICAL REVIEW B, 1995, 51 (24) :17916-17924
[6]   SCANNING TUNNELING OPTICAL MICROSCOPY [J].
COURJON, D ;
SARAYEDDINE, K ;
SPAJER, M .
OPTICS COMMUNICATIONS, 1989, 71 (1-2) :23-28
[7]   IMAGING OF SURFACE-PLASMON PROPAGATION AND EDGE INTERACTION USING A PHOTON SCANNING TUNNELING MICROSCOPE [J].
DAWSON, P ;
DEFORNEL, F ;
GOUDONNET, JP .
PHYSICAL REVIEW LETTERS, 1994, 72 (18) :2927-2930
[8]  
DEFORNEL F, 1989, P SOC PHOTO-OPT INS, V77, P1139
[9]   NEAR-FIELD PLASMON AND FORCE MICROSCOPY [J].
DEHOLLANDER, RBG ;
VANHULST, NF ;
KOOYMAN, RPH .
ULTRAMICROSCOPY, 1995, 57 (2-3) :263-269
[10]  
GORDON JG, 1977, OPT COMMUN, V22, P374, DOI 10.1016/S0030-4018(97)90032-8