In situ surface X-ray diffraction using a new electrochemical cell optimised for third generation synchrotron light sources

被引:11
作者
Brossard, F
Etgens, VH
Tadjeddine, A
机构
[1] UNIV PARIS 06,LAB MINERAL CRISTALLOG,F-75252 PARIS 05,FRANCE
[2] UNIV PARIS 07,CNRS,F-75252 PARIS 05,FRANCE
[3] CTR UNIV PARIS SUD,UTILISAT RAYONNEMENT ELECTROMAGNET LAB,F-91405 ORSAY,FRANCE
关键词
D O I
10.1016/S0168-583X(97)00285-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Thanks to the new third-generation high energy synchrotron radiation sources it is now possible to study electrochemical interfaces in situ using a cell fulfilling all the electrochemistry requirements. We are presenting here one version of this cell type, especially designed for surface X-ray diffraction. Its geometry allows in and out of plane data collection with the voltammetry fully controlled at any time. Fresh results concerning the gold (111) surface evolution in diluted H2SO4 electrolyte are presented. Finally, the perspectives opened by this in situ studies are discussed.
引用
收藏
页码:419 / 422
页数:4
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