Ellipsometric measurements by use of photon pairs generated by spontaneous parametric downconversion

被引:25
作者
Abouraddy, AF [1 ]
Toussaint, KC [1 ]
Sergienko, AV [1 ]
Saleh, BEA [1 ]
Teich, MC [1 ]
机构
[1] Boston Univ, Dept Elect & Comp Engn, Quantum Imaging Lab, Boston, MA 02215 USA
关键词
D O I
10.1364/OL.26.001717
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme, Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration. (C) 2001 Optical Society of America.
引用
收藏
页码:1717 / 1719
页数:3
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