Anisotropic etching of inverted pyramids in the sub-100 nm region

被引:11
作者
Hantschel, T
Vandervorst, W
机构
[1] IMEC vzw, B-3001 Leuven
关键词
D O I
10.1016/S0167-9317(96)00090-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have investigated the generation of inverted pyramids in the sub-100 nm region. A process based on e-beam lithography and anisotropic etching in aqueous KOH was developed which allows the generation of sub-100 nm pyramidal etch pits in a reproducible manner. Inverted pyramids as small as 75 nm with a period of 130 nm were produced. AFM-measurements have shown that such etch pits possess a very sharp tip curvature radius which was typically below 5 nm. In order to demonstrate that these structures can be further processed, the pyramidal etch pits were filled with metal and the supporting silicon was finally removed.
引用
收藏
页码:405 / 407
页数:3
相关论文
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