Element-specific contrast in scanning tunneling microscopy via resonant tunneling

被引：2

作者：

Himpsel, FJ ^{[1
]}

Jung, T ^{[1
]}

Schlittler, R ^{[1
]}

Gimzewski, JK ^{[1
]}

机构：

[1] IBM CORP, DIV RES, CH-8803 RUSCHLIKON, SWITZERLAND

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 6B期

关键词：

STM; inverse photoemission; nanostructures; image states; microprobe; surfaces; steps; growth;

D O I：

10.1143/JJAP.35.3695

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An element-specific version of scanning tunneling spectroscopy for metals is presented. Contrast between two metals is achieved by resonant tunneling via surface states and image states. These states are characterized independently by inverse photoemission. Image states provide elemental identification via the work function; since their energy is correlated with the local work function. Element-specific surface states produce contrast at higher spatial resolution, but the contrast is smaller than that for image states. These imaging techniques are used to study the growth modes of Cu stripes on stepped W(110) and Mo(110) surfaces.

引用

页码：3695 / 3699

页数：5

共 44 条

[1] OBSERVATION OF QUANTUM-SIZE EFFECTS AT ROOM-TEMPERATURE ON METAL-SURFACES WITH STM [J].