Single-element objective lens for soft x-ray differential interference contrast microscopy

被引：40

作者：

Chang, C ^{[1
]}

Sakdinawat, A

Fischer, P

Anderson, E

Attwood, D

机构：

[1] Drexel Univ, Sch Biomed Engn Sci & Hlth Syst, Philadelphia, PA 19104 USA

[2] Univ Calif Berkeley, Univ Calif San Francisco, Joint Grad Grp Bioengn, Berkeley, CA 94720 USA

[3] Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA

[4] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA

来源：

OPTICS LETTERS | 2006年 / 31卷 / 10期

关键词：

D O I：

10.1364/OL.31.001564

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

High-resolution soft x-ray differential interference contrast (DIC) imaging was demonstrated through the use of a single-element objective, the XOR pattern, in a full-field soft x-ray microscope. DIC images of the magnetic domains in a 59 nm thick amorphous Gd25Fe75 layer were obtained and magnetic phase contributions were directly imaged. With its elemental, chemical, and magnetic specificity, compatibility with various sample environments, and ease of implementation, we expect this soft x-ray DIC technique to become one of the standard modes of operation for existing full-field soft x-ray microscopes. (c) 2006 Optical Society of America.

引用

页码：1564 / 1566

页数：3

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