Fringe fields in nonlinear photoemission microscopy

被引:37
作者
Chelaru, LI [1 ]
Horn-von Hoegen, M [1 ]
Thien, D [1 ]
zu Heringdorf, FJM [1 ]
机构
[1] Univ Duisburg Essen, Fachbereich Phys, D-47057 Duisburg, Germany
关键词
D O I
10.1103/PhysRevB.73.115416
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Self-organized Ag nanostructures have been investigated by photoemission electron microscopy where the electrons are generated by femtosecond laser pulses through a two-photon photoemission process. Bright and dark areas are observed around the nanostructures when they exceed a certain lateral dimension. The features are different for both directions of the polarization of the incoming light and s and p polarization. In p polarization the features consist of several interference fringes that are explained by diffraction. The photoemission yield of Ag nanowires also shows a dependence on the polarization direction of the incoming light with respect to the orientation of the nanowire. This is explained with a particle plasmon state in the Ag nanostructures that acts as the intermediate state for two-photon photoemission. Also, we present evidence of far-field mediating interaction between neighboring Ag nanostructures.
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页数:5
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