Wavelet filtering applied to time-average digital speckle pattern interferometry fringes

被引:23
作者
Kumar, R [1 ]
Singh, SK [1 ]
Shakher, C [1 ]
机构
[1] Indian Inst Technol, Laser Applicat & Holog Lab, Instrument Design Dev Ctr, New Delhi 110016, India
关键词
digital speckle pattern interferometry; vibration; contrast; histogram equalization; Symlet wavelet;
D O I
10.1016/S0030-3992(01)00065-2
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper we are presenting a filtering scheme using Symlet wavelet to remove the speckle noise from the time-averaged digital speckle pattern interferometry fringes. To demonstrate the potential of Symlet wavelet filtering, experiments are conducted to remove the speckle noise from the fringes recorded for the surface of computer hard disk. Experimental results demonstrate that this filtering removes the speckle noise to the large extent. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:567 / 571
页数:5
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