Vanadium oxides thin films grown on rutile TiO2(110)-(1 x 1) and (1 x 2) surfaces

被引:60
作者
Guo, Q [1 ]
Lee, S [1 ]
Goodman, DW [1 ]
机构
[1] Texas A&M Univ, Dept Chem, College Stn, TX 77842 USA
关键词
Auger electron spectroscopy; electron energy loss spectroscopy (EELS); low energy electron diffraction (LEED); X-ray photoelectron spectroscopy; vanadium oxide; titanium oxide; metal-insulator surfaces; single crystal epitaxy;
D O I
10.1016/S0039-6028(99)00674-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Vanadium oxides on rutile TiO2(110)-(1 x 1) and (1 x 2) surfaces have been prepared under ultrahigh vacuum conditions by evaporation of vanadium in background O-2 and characterized by various vacuum surface analytical techniques. Auger electron spectroscopy (AES), low-energy electron diffraction (LEED), high-resolution electron energy loss spectroscopy (HREELS) and X-ray photoelectron spectroscopy (XPS) including core-level and X-ray-induced valence band, indicate the formation of V2O3 on both substrates at vanadia coverages greater than one monolayer equivalent (MLE). The dispersion of vanadia is higher on the (1 x 2) surface than on the (1 x 1) surface. At lower coverages <1 MLE, the interface shows two chemical states of vanadium, V3+ and V4+. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:38 / 48
页数:11
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