Characterization of self-similar dislocation structures by X-ray diffraction

The development of the statistical parameters of the dislocation structure during plastic deformation of copper single crystals (average dislocation density, and average dislocation density fluctuation) was investigated by the method of X-ray diffraction peak profile analysis. It is found that during the deformation process, while the dislocation density increases monotonically, the average fluctuation exhibits a maximum corresponding to the transition from stage II to stage III of work hardening. The fractal dimension of the dislocation structure was also investigated. A strong correlation was found between the fractal dimension and the relative dislocation density fluctuation. (C) 2002 Elsevier Science B.V. All rights reserved.