Brightness degradation in electroluminescent ZnS:Cu

被引：23

作者：

Brese, NE

Rohrer, CL

Rohrer, GS

机构：

[1] Rohm & Haas Co, Spring House, PA 19477 USA

[2] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA

来源：

SOLID STATE IONICS | 1999年 / 123卷 / 1-4期

基金：

美国国家科学基金会;

关键词：

electroluminescence; ZnS; bond valence; Monte Carlo; diffusion;

D O I：

10.1016/S0167-2738(99)00091-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Monte Carlo simulations using crystal chemical constraints have been used to elucidate the copper diffusion mechanisms in copper-doped zinc sulfide. Relaxation around the ZnS\Cu2-xS interface allows facile copper diffusion, particularly in the presence of substitutional oxygen or sulfur vacancies. Copper diffusion is responsible for the brightness degradation in this electroluminescent material. Reducing sulfur vacancies and substitutional oxygen species are outlined as ways to reduce the luminescence decay. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：19 / 24

页数：6

共 24 条

[1]

ACIOLI PH, 1997, THEOCHEM-J MOL STRUC, V394, P75

[2] ATOMISTIC MODELING OF MATERIALS PROPERTIES BY MONTE-CARLO SIMULATION [J].