Growth of Pt/Cu(100): Formation of a surface alloy

被引:15
作者
Belkhou, R [1 ]
Thiele, J [1 ]
Guillot, C [1 ]
机构
[1] CTR ETUD SACLAY,CEA,DRECAM,SRSIM,F-91191 GIF SUR YVETTE,FRANCE
关键词
copper; diffusion and migration; growth; low energy electron diffraction (LEED); low index single crystal surfaces; platinum; surface segregation; synchrotron radiation photoelectron spectroscopy;
D O I
10.1016/S0039-6028(96)01527-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Synchrotron-radiation induced core-level photoemission spectroscopy (PES) has been used to characterise the growth of Pt:Cu(100). Decomposition of the Pt 4f(7/2) photoemission lines shows, for Pt deposition up to 2 ML, the formation during the growth process of an extended Pt-Cu surface alloy. We estimate the Pt concentration in the surface layer to bz 50%. This result is consistent with the observed c(2 x 2) LEED pattern. For higher coverage, the surface alloy is destroyed and a pure and disordered Pt thin film starts to grow. Annealing of the surface alloy formed during the growth of the pure Pt thin film at 300 degrees C leads to the same situation: formation of a surface alloy due to a kinetic blocking of the dissolution. The surface composition of this surface alloy is Cu50Pt50. This particular behaviour of the kinetics of dissolution has been already observed in PtCu(111).
引用
收藏
页码:948 / 952
页数:5
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