A fast and accurate amplitude-only transmission-reflection method for complex permittivity determination of lossy materials

被引：78

作者：

Hasar, Ugur Cem ^{[1
,2
]}

机构：

[1] Ataturk Univ, Dept Elect & Elect Engn, TR-25240 Erzurum, Turkey

[2] SUNY Binghamton, Dept Elect & Comp Engn, Binghamton, NY USA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2008年 / 56卷 / 09期

关键词：

amplitude; materials testing; microwave measurements; permittivity;

D O I：

10.1109/TMTT.2008.2002229

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 [电气工程]; 0809 [电子科学与技术];

摘要：

Complex scattering parameter measurements using expensive vector network analyzers make microwave techniques inconvenient, for industrial-based applications. In industry, accurate and fast evaluation of materials' properties using a relatively inexpensive measurement setup is a key issue. In this paper, we derive an objective function for fast and accurate complex permittivity (e) determination of lossy materials using amplitude-only reflection and transmission scattering parameter measurements. The measurements can be carried out by relatively inexpensive microwave instruments such as a scalar network analyzer. The domain for computations of the e is significantly reduced to facilitate, rapid e determination. The objective function is verified by measurements of a commercially available antifreeze solution and binary mixture of ethyl alcohol and water solution.

引用

页码：2129 / 2135

页数：7

共 23 条

[1]

ANDERSON KW, 1979, ELEMENTARY REAL ANAL

[2]

[Anonymous], 2003, PRINCIPLES OPTICS EL

[3]

Baker-Jarvis J., 1993, Transmission/reflection and short-circuit line methods for measuring permittivity and permeability

[4]

Baker-Jarvis J., 1990, 1341 NIST

[5]

IMPROVED TECHNIQUE FOR DETERMINING COMPLEX PERMITTIVITY WITH THE TRANSMISSION REFLECTION METHOD [J].

BAKERJARVIS, J ;

VANZURA, EJ ;

KISSICK, WA .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (08) :1096-1103

[6]

Balanis C. A., 1989, Advanced engineering electromagnetics

[7]

Dielectric plug-loaded two-port transmission line measurement technique for dielectric property characterization of granular and liquid materials [J].

Bois, KJ ;

Handjojo, LF ;

Benally, AD ;

Mubarak, K ;

Zoughi, R .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (06) :1141-1148

[8]

Noniterative stable transmission/reflection method for low-loss material complex permittivity determination [J].

Boughriet, AH ;

Legrand, C ;

Chapoton, A .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1997, 45 (01) :52-57

[9]

THRU-REFLECT-LINE - IMPROVED TECHNIQUE FOR CALIBRATING THE DUAL 6-PORT AUTOMATIC NETWORK ANALYZER [J].

ENGEN, GF ;

HOER, CA .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1979, 27 (12) :987-993

[10]

Electromagnetic characterization of layered materials via direct and de-embed methods [J].

Havrilla, MJ ;

Nyquist, DP .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2006, 55 (01) :158-163

← 1 2 3 →