External charge state detection of a double-dot system

被引:30
作者
Amlani, I
Orlov, AO
Snider, GL
Lent, CS
Bernstein, GH
机构
[1] Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN
关键词
D O I
10.1063/1.120018
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report direct measurements of the charging diagram of a nanoscale series double-dot system at low temperatures. Our device consists of two metal dots in series, with each dot capacitively coupled to another single dot serving as an electrometer. This configuration allows us to externally detect all possible charge transitions within a double-dot system. In particular, we show that transfer of an electron between two dots, representing a polarization switch of the double dot, can be most prominently detected by our differential sensing scheme. We also perform theoretical calculations of the device characteristics and find excellent agreement with experiment. We discuss possible applications as an output stage for quantum-dot cellular automata architecture. (C) 1997 American Institute of Physics.
引用
收藏
页码:1730 / 1732
页数:3
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