Nanoscale EELS analysis of oxides: composition mapping, valence determination and beam damage

被引：23

作者：

Bentley, J. ^{[1
]}

Gilliss, S. R. ^{[2
]}

Carter, C. B. ^{[2
]}

Al-Sharab, J. F. ^{[3
]}

Cosandey, F. ^{[3
]}

Anderson, I. M. ^{[1
]}

Kotula, P. J. ^{[4
]}

机构：

[1] Oak Ridge Natl Lab, Met & Ceram Div, POB 2008, Oak Ridge, TN 37831 USA

[2] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA

[3] Rutgers State Univ, Ceram & Mat Engn, Piscataway, NJ 08904 USA

[4] Sandia Natl Labs, Mat Characterizat Dept, Albuquerque, NM 87185 USA

来源：

EMAG-NANO 2005: IMAGING, ANALYSIS AND FABRICATION ON THE NANOSCALE | 2006年 / 26卷

基金：

美国国家科学基金会;

关键词：

D O I：

10.1088/1742-6596/26/1/016

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Beam damage to ceria abrasive particles during EELS measurements with -1 nm probes of similar to 1 nA was negligible for typical analysis times (1-5 s). Ce3+ and tri-valent impurities reduce near-surface regions. Ce valence was measured from Ce M-5/M-4 white line ratios. By defocusing a 1 nA probe to similar to 5 nm, beam damage to nanoscale MgAl2O4 spinel was sufficiently slowed to allow spectrum imaging measurements of composition variations. Recording spectrum lines in TEM mode can be attractive when dose-rate rather than dose is the limiting factor in beam damage. Multivariate statistical analysis of data from a CoO-Co3O4 interface has revealed an additional interface-related component.

引用

页码：69 / +

页数：2

共 9 条

[1]

ALSHARAB JF, UNPUB J AM CERAM SOC

[2]

Anderson IM, 1997, MAT RES S C, V458, P81

[3]

BENTLEY J, 1996, P MICR MICR SAN FRAN, P532

[4] Electron energy-loss spectroscopic study of the surface of ceria abrasives [J].

Gilliss, SR ;

Bentley, J ;

Carter, CB .

APPLIED SURFACE SCIENCE, 2005, 241 (1-2) :61-67

[5]

GILLISS SR, 2004, THESIS U MINNESOTA

[6]

GILLISS SR, 2003, MICROSC MICROANAL, V9, P420

[7] Adsorption and reaction of H2O and CO on oxidized and reduced Rh/CeOx(111) surfaces [J].

Kundakovic, L ;

Mullins, DR ;

Overbury, SH .

SURFACE SCIENCE, 2000, 457 (1-2) :51-62

[8] QUANTITATIVE ELECTRON-ENERGY LOSS SPECTROSCOPY ON M45 EDGES IN RARE-EARTH-OXIDES [J].

MANOUBI, T ;

COLLIEX, C ;

REZ, P .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1990, 50 (1-2) :1-18

[9] Electron spectroscopy of single crystal and polycrystalline cerium oxide surfaces [J].

Mullins, DR ;

Overbury, SH ;

Huntley, DR .

SURFACE SCIENCE, 1998, 409 (02) :307-319

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