Electrical resistance tomography for process applications

被引:294
作者
Dickin, F [1 ]
Wang, M [1 ]
机构
[1] UNIV MANCHESTER, INST SCI & TECHNOL, DEPT CHEM ENGN, PROC TOMOG GRP, MANCHESTER M60 1QD, LANCS, ENGLAND
关键词
D O I
10.1088/0957-0233/7/3/005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Measurement of electrical resistivity via four probes is widely used in a variety of applications ranging from geophysical prospecting to silicon wafer manufacture. Electrical resistivity tomography is an extension of this approach and is performed via an array of equi-spaced electrodes mounted into the periphery of a process vessel to map non-intrusively the spatial distribution of resistivities within. The digitized boundary data are 'inverted' by an image reconstruction algorithm to produce a map of the internal resistivity distribution. This paper focuses on the design and operation of flexible electrical resistivity tomography instrumentation for use on laboratory- and plant-scale process equipment.
引用
收藏
页码:247 / 260
页数:14
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