Theory of noncontact dissipation force microscopy

被引：86

作者：

Gauthier, M ^{[1
]}

Tsukada, M ^{[1
]}

机构：

[1] Univ Tokyo, Dept Phys, Grad Sch Sci, Bunkyo Ku, Tokyo 1130033, Japan

来源：

PHYSICAL REVIEW B | 1999年 / 60卷 / 16期

关键词：

D O I：

10.1103/PhysRevB.60.11716

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The interaction between the tip of the noncontact atomic force microscope (nc-AFM) and a surface is analyzed using the Langevin equation approach. The existence of an intrinsically local energy dissipation mechanism is demonstrated. This mechanism fundamentally differs from that related to adhesion hysteresis between the tip and the surface. A scheme referred to as noncontact dissipation force microscopy is proposed for producing surface images in ultrahigh vacuum. Moreover, a prospect for scanning probe microscopy is raised, namely, the possibility of measuring nanomechanical surface properties. It is also shown how nc-AFM operated at large amplitude could be used in principle to measure profiles of both the tip-surface interaction force and its gradient. [S0163-1829(99)00740-7].

引用

页码：11716 / 11722

页数：7

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