Shape from shading: A survey

被引:1085
作者
Zhang, R [1 ]
Tsai, PS
Cryer, JE
Shah, M
机构
[1] Univ Cent Florida, Sch Comp Sci, Comp Vis Lab, Orlando, FL 32816 USA
[2] Intel Corp, Chandler, AZ 85226 USA
基金
美国国家科学基金会;
关键词
shape from shading; analysis of algorithms; Lambertian model; survey of shape from shading algorithms;
D O I
10.1109/34.784284
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Since the first shape-from-shading (SFS) technique was developed by Horn in the early 1970s, many different approaches have emerged. In this paper, six well-known SFS algorithms are implemented and compared. The performance of the algorithms was analyzed on synthetic images using mean and standard deviation of depth (Z) error, mean of surface gradient (p, q) error, and CPU timing. Each algorithm works well for certain images, but performs poorly for others. In general, minimization approaches are more robust, while the other approaches are faster. The implementation of these algorithms in C and images used in this paper are available by anonymous ftp under the pub/tech_paper/survey directory at eustis.cs.ucf.edu (132.170.108.42). These are also part of the electronic Version of paper.
引用
收藏
页码:690 / 706
页数:17
相关论文
共 54 条
[1]  
[Anonymous], P 2 INT C COMP VIS
[2]   A MULTIGRID METHOD FOR SHAPE FROM SHADING [J].
ASCHER, UM ;
CARTER, PM .
SIAM JOURNAL ON NUMERICAL ANALYSIS, 1993, 30 (01) :102-115
[3]   RETROSPECTIVE ON INTERPRETING LINE DRAWINGS AS 3-DIMENSIONAL SURFACES [J].
BARROW, HG ;
TENENBAUM, JM .
ARTIFICIAL INTELLIGENCE, 1993, 59 (1-2) :71-80
[4]  
Berthold KP Horn, 1970, SHAPE SHADING METHOD, P1
[5]  
BICHSEL M, 1992, IEEE P COMP VIS PATT, P459
[6]   SURFACE DESCRIPTIONS FROM STEREO AND SHADING [J].
BLAKE, A ;
ZISSERMAN, A ;
KNOWLES, G .
IMAGE AND VISION COMPUTING, 1985, 3 (04) :183-191
[7]   THE EIKONAL EQUATION - SOME RESULTS APPLICABLE TO COMPUTER VISION [J].
BRUSS, AR .
JOURNAL OF MATHEMATICAL PHYSICS, 1982, 23 (05) :890-896
[8]  
CLARK JJ, 1992, IEEE COMPUTER VISION, P29
[9]  
CRYER JE, 1993, IEEE COMP SOC C COMP, P720
[10]  
DUPUIS P, 1992, IEEE P COMP VIS PATT, P453