The vibroscanning method for the measurement of micro-hole profiles

被引:38
作者
Kim, B
Masuzawa, T
Bourouina, T
机构
[1] Univ Tokyo, Inst Ind Sci, Minato Ku, Tokyo 106, Japan
[2] Univ Paris 11, IEF, CNRS, URA O22, F-91405 Orsay, France
关键词
micro-holes; dimensional measurement; silicon-based micro-twin probe;
D O I
10.1088/0957-0233/10/8/304
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, we present technologies for measuring inner dimensions of small holes. In the first method with a single probe system, the electrical contact between a vibrating probe and the inner surface of a hole is detected and the duty factor of the contact is measured. Through controlled scanning by a probe with a constant duty factor, data on the ups and downs of the surface profile are obtained. To characterize inside profiles of micro-holes regardless of materials, we developed a new technology with a twin-probe system. With a silicon-based micro-twin probe 3 mm in length, a micro-hole with a diameter of around 125 mu m was measured and the estimated imprecision of measurement on this set-up is smaller than 0.5 mu m.
引用
收藏
页码:697 / 705
页数:9
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