Soft-x-ray interferometer for single-shot laser linewidth measurements

被引：21

作者：

Chilla, JLA ^{[1
]}

Rocca, JJ ^{[1
]}

Martinez, OE ^{[1
]}

Marconi, MC ^{[1
]}

机构：

[1] UNIV BUENOS AIRES,DEPT FIS,RA-1428 BUENOS AIRES,DF,ARGENTINA

来源：

OPTICS LETTERS | 1996年 / 21卷 / 13期

关键词：

D O I：

10.1364/OL.21.000955

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed. (C) 1996 Optical Society of America.

引用

页码：955 / 957

页数：3

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