New optical probe of GHz polarization dynamics in ferroelectric thin films

被引：11

作者：

Hubert, C ^{[1
]}

Levy, J ^{[1
]}

机构：

[1] Univ Pittsburgh, Dept Phys & Astron, Pittsburgh, PA 15260 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 09期

关键词：

D O I：

10.1063/1.1149978

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe a method for measuring the response of ferroelectric thin films to microwave-frequency electric fields. A mode-locked Ti:sapphire laser is used to generate a microwave drive signal that is phase locked to an optical probe pulse. The induced polarization change in the ferroelectric film is measured stroboscopically via the electro-optic effect. Images are acquired by scanning the laser beam across the sample in a confocal geometry. Time resolution is achieved by changing the delay between the electrical pump and the optical probe. Initial results show large local phase shifts in the ferroelectric response of closely separated (1 mu m) regions of a Ba(0.5)Sr(0.5)TiO(3) thin film. This new experimental technique may help to understand the physical mechanisms of dielectric loss in these materials. (C) 1999 American Institute of Physics. [S0034-6748(99)00809-6].

引用

页码：3684 / 3687

页数：4

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