Atomic-scale friction modulated by a buried interface: Combined atomic and friction force microscopy experiments

被引：42

作者：

Maier, S. ^{[1
]}

Gnecco, E. ^{[1
]}

Baratoff, A. ^{[1
]}

Bennewitz, R. ^{[2
]}

Meyer, E. ^{[1
]}

机构：

[1] Univ Basel, Dept Phys & Astron, CH-4056 Basel, Switzerland

[2] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada

来源：

PHYSICAL REVIEW B | 2008年 / 78卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.78.045432

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Combined atomic and friction force microscopy reveals a significant modulation of atomic-scale friction related to the small periodic rumpling induced at the interface between heteroepitaxial films of KBr on NaCl(100). Transitions from dissipative atomic-scale stick slip to smooth sliding with ultralow friction are observed within the 6x6 surface unit cell of the underlying superstructure. Scanning across atomic-scale defects confirms the high-resolution capabilities of friction force microscopy close to the ultralow friction state. Strong variations of the tip-surface interaction energy across the superstructure demonstrate that subsurface chemical and size inhomogeneities dramatically change the frictional properties of the surface probed by the microscope tip.

引用

页数：5

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