Angular resolved XPS applied to V2O5-based catalysts

被引：17

作者：

Devriendt, K ^{[1
]}

Poelman, H ^{[1
]}

Fiermans, L ^{[1
]}

Creten, G ^{[1
]}

Froment, GF ^{[1
]}

机构：

[1] STATE UNIV GHENT,PETROCHEM TECH LAB,B-9000 GHENT,BELGIUM

来源：

SURFACE SCIENCE | 1996年 / 352卷

关键词：

angle resolved photoemission; photoelectron diffraction; titanium oxide; vanadium oxide; X-ray photoelectron spectroscopy;

D O I：

10.1016/0039-6028(95)01243-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Two applications of angular dependent XPS (X-ray photoelectron spectroscopy) experiments, performed with a Perkin Elmer Phi 5500 ESCA system in the framework of a monolayer catalyst research project, are illustrated. XPFS (X-ray photoelectron forward scattering) measurements were used to show the oxygen removal at the surface of catalytically reduced V2O5(001) pellets, in comparison with pure V2O5. ARXPS (angle resolved XPS) polar scans were taken from a model catalyst system (TiO2 anatase supported V2O5 layers) in order to determine their components and the chemical state of the system. With the use of the statistical technique MLCFA (maximum likelihood common factor analysis), different overlapping components in the V and Ti photoemission peaks were separated, pointing towards the existence of a V-Ti-O bonding at the V2O5/TIO2 interface.

引用

页码：750 / 754

页数：5

共 12 条

[1] VANADIUM-OXIDE MONOLAYER CATALYSTS - PREPARATION, CHARACTERIZATION AND CATALYTIC ACTIVITY [J].

BOND, GC ;

TAHIR, SF .

APPLIED CATALYSIS, 1991, 71 (01) :1-31

[2] CORE-LEVEL BINDING-ENERGY AND DENSITY OF STATES FROM SURFACE ATOMS OF GOLD [J].

CITRIN, PH ;

WERTHEIM, GK ;

BAER, Y .

PHYSICAL REVIEW LETTERS, 1978, 41 (20) :1425-1428

[3] TRANSIENT KINETICS FROM THE TAP REACTOR SYSTEM - APPLICATION TO THE OXIDATION OF PROPYLENE TO ACROLEIN [J].

CRETEN, G ;

LAFYATIS, DS ;

FROMENT, GF .

JOURNAL OF CATALYSIS, 1995, 154 (01) :151-162

[4] CHEMICAL INFORMATION OBTAINED FROM AUGER DEPTH PROFILES BY MEANS OF ADVANCED FACTOR-ANALYSIS (MLCFA) [J].

DEVOLDER, P ;

HOOGEWIJS, R ;

DEGRYSE, R ;

FIERMANS, L ;

VENNIK, J .

APPLIED SURFACE SCIENCE, 1993, 64 (01) :41-57

[5] MAXIMUM-LIKELIHOOD COMMON FACTOR-ANALYSIS IN AUGER-ELECTRON SPECTROSCOPY [J].

DEVOLDER, P ;

HOOGEWIJS, R ;

DEGRYSE, R ;

FIERMANS, L ;

VENNIK, J .

SURFACE AND INTERFACE ANALYSIS, 1991, 17 (06) :363-372

[6] X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING - A NEW TOOL FOR SURFACE CRYSTALLOGRAPHY [J].

EGELHOFF, WF .

CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1990, 16 (03) :213-235

[7] ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

FADLEY, CS .

PROGRESS IN SURFACE SCIENCE, 1984, 16 (03) :275-388

[8] THE STRUCTURE AND REDOX PROPERTIES OF VANADIUM-OXIDE SURFACE-COMPOUNDS [J].

HABER, J ;

KOZLOWSKA, A ;

KOZLOWSKI, R .

JOURNAL OF CATALYSIS, 1986, 102 (01) :52-63

[9]

HABER J, 1984, SURF SCI, V151, P301

[10] DISPERSION OF V2O5 SUPPORTED ON A TIO2 SURFACE BY X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

LIU, ZX ;

LIN, ZD ;

FAN, HJ ;

LI, FH ;

BAO, QX ;

ZHANG, SG .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1988, 45 (02) :159-164

← 1 2 →