critical current density;
superconducting filaments/wire;
superconducting materials;
transport current;
D O I:
10.1109/77.622977
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We present a series of two-dimensional simulations in transverse field as validation of a simple finite difference method for the computation of fields inside superconductors described by an extended Bean model.