Generation of digital elevation models by using SIR-C/X-SAR multifrequency two-pass interferometry: The Etna case study

被引:110
作者
Lanari, R
Fornaro, G
Riccio, D
Migliaccio, M
Papathanassiou, KP
Moreira, JR
Schwabisch, M
Dutra, L
Puglisi, G
Franceschetti, G
Coltelli, M
机构
[1] UNIV NAPLES,DIPARTIMENTO INGN ELETTRON,I-80125 NAPLES,ITALY
[2] IST UNIV NAVALE TEORIA & TECN ONDE ELETTROMAGNET,I-80133 NAPLES,ITALY
[3] GERMAN AEROSP RES ESTAB,D-82230 OBERPFAFFENHOFEN,GERMANY
[4] INST NACL PESQUISAS ESPACIAIS,BR-12227010 S JOSE CAMPOS,BRAZIL
[5] CNR,IST INT VULCANOL,I-95123 CATANIA,ITALY
来源
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING | 1996年 / 34卷 / 05期
关键词
D O I
10.1109/36.536526
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
In this paper, we exploit the interferometric multifrequency potentiality of the SIR-C/X-SAR system which is equipped with an L-, C-, and X-band sensor, We present a solution to improve the unwrapping performance of the C- and X-band data by considering the L-band unwrapped pattern, A new algorithm for the generation of a single digital elevation model (DEM) combining L-, C-, and X-band information is presented, This solution is based on the fusion of the unwrapped phase patterns by using a Kalman filter, The proposed fusion operation also accounts for the coherence characteristics of the three data sets, The selected test site is the Mt, Etna region in Italy which is very interesting from the volcanological and geological point of view, Numerical assessments of the achieved results are provided by evaluating the height accuracy with respect to a reference DEM.
引用
收藏
页码:1097 / 1114
页数:18
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