Ordered self-assembly of nanosize polystyrene aggregates on mica

被引:46
作者
Karthaus, O
Ijiro, K
Shimomura, M
机构
[1] HOKKAIDO UNIV, RES INST ELECT SCI, KITA KU, SAPPORO, HOKKAIDO 060, JAPAN
[2] RES DEV CORP JAPAN, PRESTO, KAWAGUCHI 332, JAPAN
关键词
D O I
10.1246/cl.1996.821
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The formation of ordered patterns of nanosize polystyrene aggregates was observed by atomic force scopy. The samples were prepared by simply rinsing a mica surface with a dilute polymer solution in benzene.
引用
收藏
页码:821 / 822
页数:2
相关论文
共 9 条
  • [1] WETTING AND SLIPPAGE OF POLYMER MELTS ON SEMI-IDEAL SURFACES
    BROCHARDWYART, F
    DEGENNES, PG
    HERVERT, H
    REDON, C
    [J]. LANGMUIR, 1994, 10 (05) : 1566 - 1572
  • [2] HELLMANN J, UNPUB LANGMUIR
  • [3] UNSTABLE THIN POLYMER-FILMS - RUPTURE AND DEWETTING PROCESSES
    REITER, G
    [J]. LANGMUIR, 1993, 9 (05) : 1344 - 1351
  • [4] Copolymers at surfaces and interfaces
    Russell, TP
    [J]. CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 1996, 1 (01) : 107 - 115
  • [5] Photoinduced electron transfer reactions through dendrimer architecture
    Sadamoto, R
    Tomioka, N
    Aida, T
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1996, 118 (16) : 3978 - 3979
  • [6] ULTRATHINNING-INDUCED SURFACE PHASE-SEPARATION OF POLYSTYRENE POLY(VINYL METHYL-ETHER) BLEND FILM
    TANAKA, K
    YOON, JS
    TAKAHARA, A
    KAJIYAMA, T
    [J]. MACROMOLECULES, 1995, 28 (04) : 934 - 938
  • [7] ATOMIC-FORCE MICROSCOPIC IMAGING OF THE ETHYLENE-PROPYLENE COPOLYMER ON MICA
    YANG, JP
    LAURION, T
    JAO, TC
    FENDLER, JH
    [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1994, 98 (38) : 9391 - 9395
  • [8] INTERFACIAL BEHAVIOR OF BLOCK POLYELECTROLYTES .6. PROPERTIES OF SURFACE MICELLES AS A FUNCTION OF R AND X IN P(S260-B-VP240/RX)
    ZHU, J
    EISENBERG, A
    LENNOX, RB
    [J]. MACROMOLECULES, 1992, 25 (24) : 6556 - 6562
  • [9] INTERFACIAL BEHAVIOR OF BLOCK POLYELECTROLYTES .1. EVIDENCE FOR NOVEL SURFACE MICELLE FORMATION
    ZHU, JY
    EISENBERG, A
    LENNOX, RB
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1991, 113 (15) : 5583 - 5588