Lubrication of advanced metal evaporated tape using novel perfluoropolyether lubricants

被引：15

作者：

Bhushan, B

Tao, ZH

机构：

[1] Ohio State Univ, Nanotribol Lab Informat Storage, Columbus, OH 43202 USA

[2] Ohio State Univ, MEMS NEMS, Columbus, OH 43202 USA

来源：

MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2006年 / 12卷 / 06期

关键词：

D O I：

10.1007/s00542-006-0113-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In order to reduce the failure of advanced metal evaporated (AME) tape, novel perfluoropolyether (PFPE) lubricants, Z-TETRAOL and A20H, were deposited on an unlubricated AME tape. The degradation mechanisms of the PFPE lubricants applied on AME tape were studied using a mass spectrometer in high vacuum. The durability of various lubricants was compared using pin-on-disk experiments in high vacuum and using an accelerated tape tester in ambient air. It was found that PFPE lubricants were mainly degraded by tribochemical reaction and mechanical shear. The durability of Z-TETRAOL and A20H are higher than conventional PFPE lubricant and lubricant on experimental tape. By using ultraviolet light treatment and by applying a stearic acid overcoat, the durability of PFPE lubricants could be improved.

引用

页码：579 / 587

页数：9

共 21 条

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