Nitrogen modification of hydrogenated amorphous carbon films

被引:342
作者
Silva, SRP
Robertson, J
Amaratunga, GAJ
Rafferty, B
Brown, LM
Schwan, J
Franceschini, DF
Mariotto, G
机构
[1] UNIV CAMBRIDGE, DEPT ENGN, CAMBRIDGE CB2 1PZ, ENGLAND
[2] UNIV LIVERPOOL, DEPT ELECT ENGN, LIVERPOOL L69 3BX, MERSEYSIDE, ENGLAND
[3] UNIV CAMBRIDGE, DEPT PHYS, CAMBRIDGE CB3 0HE, ENGLAND
[4] UNIV KAISERSLAUTERN, DEPT PHYS, D-67663 KAISERSLAUTERN, GERMANY
[5] PONTIFICIA UNIV CATOLICA RIO DE JANEIRO, DEPT FIS, BR-22452970 RIO DE JANEIRO, BRAZIL
[6] UNIV TRENT, DEPT PHYS, I-38050 POVO, TRENTO, ITALY
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.363927
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of nitrogen addition on the structural and electronic properties of hydrogenated amorphous carbon (a-C:H) films has been characterized in terms of its composition, sp(3) bonding fraction, infrared and Raman spectra, optical band gap, conductivity, and paramagnetic defect. The variation of conductivity with nitrogen content suggests that N acts as a weak donor, with the conductivity first decreasing and then increasing as the Fermi level moves up in the band gap. Compensated behavior is found at about 7 at. % N, for the deposition conditions used here, where a number of properties show extreme behavior. The paramagnetic defect density and the Urbach tailwidth are each found to decrease with increasing N content. It is unusual to fmd alloy additions decreasing disorder in this manner. (C) 1997 American Institute of Physics.
引用
收藏
页码:2626 / 2634
页数:9
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