Orientational defects in ice Ih: An interpretation of electrical conductivity measurements

被引:35
作者
de Koning, M [1 ]
Antonelli, A
da Silva, AJR
Fazzio, A
机构
[1] Univ Estadual Campinas, Inst Fis Gleb Wataghin, UNICAMP, BR-13083970 Campinas, SP, Brazil
[2] Univ Sao Paulo, Inst Fis, BR-05315970 Sao Paulo, Brazil
关键词
D O I
10.1103/PhysRevLett.96.075501
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We present a first-principles study of the structure and energetics of Bjerrum defects in ice Ih and compare the results to experimental electrical conductivity data. While the DFT result for the activation energy is in good agreement with experiment, we find that its two components have quite different values. Aside from providing new insight into the fundamental parameters of the microscopic electrical theory of ice, our results suggest the activity of traps in doped ice in the temperature regime typically assumed to be controlled by the free migration of L defects.
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页数:4
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