Growth and properties of c-axis textured La0.7Sr0.3MnO3-delta films on SiO2/Si substrates with a Bi4Ti3O12 template layer

c-axis textured La0.7Sr0.3MnO3-delta (LSMO) films were fabricated on SiO2/Si(001) substrates using a Bi4Ti3O12 (BTO) template layer. Electrical and magnetic properties of LSMO were investigated. The LSMO/BTO layer of this structure has no in-plane alignment. Even though a ferromagnetic transition temperature, T-C, is as high as that of the epitaxial LSMO film (360 K), a resistivity peak temperature, T-p, is about 140 K lower than T-C. The resistivity behavior as a function of temperature for LSMO/BTO/SiO2/Si films is found to be dominated by grain boundary effects. Low field sensitive magnetoresistance which suggests spin tunneling through the grain boundaries is also observed at room temperature. (C) 1997 American Institute of Physics.