Morphology dependent fluorescence in α-sexithienyl thin film at 4.2K

被引：7

作者：

Lunedei, E ^{[1
]}

Moretti, P ^{[1
]}

Murgia, H ^{[1
]}

Muccini, M ^{[1
]}

Biscarini, F ^{[1
]}

Taliani, C ^{[1
]}

机构：

[1] CNR, Ist Spettroscopia Mol, I-40129 Bologna, Italy

来源：

SYNTHETIC METALS | 1999年 / 101卷 / 1-3期

关键词：

conjugated systems; morphology; fluorescence; excitonic emission; aggregates; atomic force microscopy;

D O I：

10.1016/S0379-6779(98)01148-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigated by fluorescence spectroscopy at 4.2K high vacuum sublimated thin films of alpha-sexithienyl grown on mica upon a systematic variation of the growth parameters. We studied how the film morphology, induced by different conditions of growth (thickness and substrate temperature), acts on the emission properties at the early stages of growth. We show how the increased molecular order corresponds to a less efficient excitation energy transfer to low energy levels (due to the presence of defects and aggregates) and to an enhanced excitonic character of the fluorescence.

引用

页码：592 / 593

页数：2

共 8 条

[1] GROWTH OF CONJUGATED OLIGOMER THIN-FILMS STUDIED BY ATOMIC-FORCE MICROSCOPY [J].