Vanadium pentoxide thin films deposited by atomic layer deposition: A model electrode for investigating the structural changes induced by lithium intercalation

被引：3

作者：

Baddour-Hadjean, R

Golabkan, V

Pereira-Ramos, JP

Mantoux, A

Lincot, D

机构：

[1] Univ Paris 06, CNRS, LADIR, UMR 7075, F-94320 Thiais, France

[2] Univ Paris 12, CNRS, LECSO, UMR 7582, F-94320 Thiais, France

[3] Ecole Natl Super Chim Paris, LECA, UMR 7574, F-75231 Paris, France

来源：

JOURNAL DE PHYSIQUE IV | 2001年 / 11卷 / PR11期

关键词：

D O I：

10.1051/jp4:20011113

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Micro-Raman spectrometry has been applied to the characterization of the structural changes induced by lithium accomodation in V2O5 thin films prepared by Atomic Layer Deposition. The good homogeneity and cristallinity of the films has allowed to obtain high resolution Raman spectra and to follow their transformation as lithium electrochemical insertion proceeds in V2O5 cathodic films. New informations on the vibrational fingerprints of the different lithiated phases are reported here up to a lithium content of 1.4 Li/V2O5.

引用

页码：85 / 90

页数：6

共 16 条

[1] VIBRATIONAL-SPECTRA AND VALENCE FORCE-FIELD OF CRYSTALLINE V2O5 [J].