Electron-impact detachment from negative ions

被引：95

作者：

VejbyChristensen, L ^{[1
]}

Kella, D ^{[1
]}

Mathur, D ^{[1
]}

Pedersen, HB ^{[1
]}

Schmidt, HT ^{[1
]}

Andersen, LH ^{[1
]}

机构：

[1] TATA INST FUNDAMENTAL RES, BOMBAY 400005, MAHARASHTRA, INDIA

来源：

PHYSICAL REVIEW A | 1996年 / 53卷 / 04期

关键词：

D O I：

10.1103/PhysRevA.53.2371

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Electron-impact detachment cross sections have been measured from threshold to about 30 eV for D- and O-. The purpose was to investigate the cross section near threshold and to reinvestigate earlier claims of resonances due to short-lived states of the doubly charged negative ion. Initial results for D- showed no resonances [L. H. Andersen, D. Mathur, H. T. Schmidt, and L. Vejby-Christensen, Phys. Rev. Lett. 74, 892 (1995)]. Here we show that there is no detectable resonance structure for O- either. The applied experimental technique is discussed in detail. Classical and semiclassical models for the detachment process are presented and compared with the data.

引用

页码：2371 / 2378

页数：8

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