Probing the organization of adsorbed protein layers:: Complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

被引：38

作者：

Dufrêne, YF ^{[1
]}

Marchal, TG ^{[1
]}

Rouxhet, PG ^{[1
]}

机构：

[1] Univ Catholique Louvain, Unite Chim Interfaces, B-1348 Louvain, Belgium

来源：

APPLIED SURFACE SCIENCE | 1999年 / 144-45卷

关键词：

atomic force microscopy; adsorbed protein layers; X-ray photoelectron spectroscopy; radiolabeling;

D O I：

10.1016/S0169-4332(98)00881-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Atomic force microscopy (AFM) has been used to investigate the organization of the collagen layer present on polymer substrata after adsorption and drying, while the adsorbed amount was monitored using X-ray photoelectron spectroscopy (XPS) and radiochemical measurements. Differences in the organization of the adsorbed collagen layer (surface coverage, layer thickness) observed by AFM fitted well with those found by models obtained from XPS and radiolabeling data. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：638 / 643

页数：6

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