High resolution microtomography for density and spatial information about wood structures

被引:12
作者
Illman, B [1 ]
Dowd, B [1 ]
机构
[1] Univ Wisconsin, USDA, FS, Forest Prod Lab, Madison, WI 53705 USA
来源
DEVELOPMENTS IN X-RAY TOMOGRAPHY II | 1999年 / 3772卷
关键词
microtomography; synchrotron x-ray tomography; wood;
D O I
10.1117/12.363722
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
Microtomography has successfully been used to characterize loss of structural integrity of wood. Tomographic images were generated with the newly developed third generation x-ray computed microtomography (XCMT) instrument at the X27A beamline at the national Synchrotron Light source (NSLS). The beamline is equipped with high-flux x-ray monochromator based on multilayer optics developed for this application. The sample is mounted on a translation stage with which to center the sample rotation, a rotation stage to perform the rotation during data collection and a motorized goniometer head far small alignment motions. The absorption image is recorded by a single-crystal scintillator, an optical microscope and a cooled CCD array detector. Data reconstruction has provided three-dimensional geometry of the heterogeneous wood matrix in microtomographic images. Wood is a heterogeneous material composed of long lignocellulose vessels. Although wood is a strong natural product, fungi have evolved chemical systems that weaken the strength properties of wood by degrading structural vessels. Tomographic images with a resolution of three microns were obtained nonintrusively to characterize the compromised structural integrity of wood. Computational tools developed by Lindquist et al (1996) applied to characterize the microstructure of the tomographic volumes.
引用
收藏
页码:198 / 204
页数:7
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