Structural defects caused by a rough substrate and their influence on the performance of hydrogenated nano-crystalline silicon n-i-p solar cells

被引：117

作者：

Li, Hongbo B. T. ^{[1
]}

Franken, Ronald H. ^{[1
]}

Rath, Jatindra K. ^{[1
]}

Schropp, Ruud E. I. ^{[1
]}

机构：

[1] Univ Utrecht, Fac Sci, Debye Inst Nanomat Sci, NL-3508 TA Utrecht, Netherlands

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2009年 / 93卷 / 03期

关键词：

Nano-crystalline silicon; Solar cell; Rough substrate; Chemical vapour deposition; OPEN-CIRCUIT VOLTAGE; A-SI-H; NANOCRYSTALLINE SILICON; FILM;

D O I：

10.1016/j.solmat.2008.11.013

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

We present a cross-sectional transmission electron microscopy study of a set of hydrogenated nanocrystalline silicon n-i-p solar cells deposited by hot-wire chemical vapour deposition on Corning glass substrates coated with ZnO-covered Ag layers with various surface roughnesses. Strip-like structural defects (voids and low-density areas) are observed in the silicon layers originating from micro-valleys of Ag grains. A correlation between the opening angles of the textured surface and the appearance of these strips was found. We propose that in order to grow high-quality hydrogenated nano-crystalline silicon absorber layers for solar cell applications. the morphology of the Ag surface is a critical property. and the micro-valleys at the ZnO surface with an opening angle smaller than around 110 degrees should be avoided. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：338 / 349

页数：12

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