Probing local coordination environments in high-k materials for gate stack applications

被引:17
作者
McComb, DW [1 ]
Craven, AJ
Hamilton, DA
MacKenzie, M
机构
[1] Univ London Imperial Coll Sci Technol & Med, Dept Mat, London SW7 2AZ, England
[2] Univ Glasgow, Dept Phys & Astron, Glasgow G12 8QQ, Lanark, Scotland
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.1758303
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using electron energy-loss spectroscopy, the oxygen K-edge excitation in a range of crystalline standards relevant to candidate high-k materials has been examined. The spectra have been modeled using electronic structure calculations in order to understand the influence of the local coordination environment on the data. The knowledge obtained is used to probe the local atomic structure in thin amorphous films of "HfSiO." (C) 2004 American Institute of Physics.
引用
收藏
页码:4523 / 4525
页数:3
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