Effect of F AF coupling strength on the magnetization process of F AF system

被引:19
作者
Hou, C
Fujiwara, H
Ueda, F
机构
[1] Univ Alabama, MINT Ctr, Tuscaloosa, AL 35487 USA
[2] Univ Alabama, Dept Phys, Tuscaloosa, AL 35487 USA
基金
美国国家科学基金会;
关键词
antiferromagnetic layer; ferromagnetic layer; exchange coupling; pinning field; coercivity; model;
D O I
10.1016/S0304-8853(98)01165-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of the exchange coupling strength J between NiFe and FeMn layers on the magnetization process in NiFe/FeMn structures was investigated. Samples with structures of NiFe/impurity (or Cu)/FeMn and NiFe/FeMn were prepared and measured to determine their hysteresis loop shift H(p) and coercivity H(c). It is often assumed that H(p) is proportional to J. However, our results show that H(p) dependence on J is not monotonic. A phenomenological model is proposed to explain the results. A better method for estimation of J is also proposed. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:450 / 452
页数:3
相关论文
共 9 条
[1]   THERMAL FLUCTUATION AFTEREFFECT MODEL FOR SOME SYSTEMS WITH FERROMAGNETIC-ANTIFERROMAGNETIC COUPLING [J].
FULCOMER, E ;
CHARAP, SH .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) :4190-&
[2]  
JUNGBLUT R, 1986, J MAGN MAGN MATER, V148, P801
[3]   MECHANISMS OF EXCHANGE-ANISOTROPY [J].
MALOZEMOFF, AP .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (08) :3874-3879
[4]   SIMPLE-MODEL FOR THIN FERROMAGNETIC-FILMS EXCHANGE COUPLED TO AN ANTIFERROMAGNETIC SUBSTRATE [J].
MAURI, D ;
SIEGMANN, HC ;
BAGUS, PS ;
KAY, E .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :3047-3049
[5]  
NEEL L, 1967, ANN PHYS-PARIS, V61, P2
[6]   Grain size effect on ferro-antiferromagnetic coupling of NiFe/FeMn systems [J].
Nishioka, K ;
Hou, CH ;
Fujiwara, H ;
Metzger, RD .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (08) :4528-4533
[7]  
QIAN, 1998, 7 JOINT MMM INTERMAG
[8]  
SCHLENKER C, 1986, J MAGN MAGN MATER, V54, P300
[9]   TEMPERATURE-DEPENDENCE OF UNIDIRECTIONAL ANISOTROPY EFFECTS IN THE PERMALLOY-FEMN SYSTEMS [J].
TSANG, C ;
LEE, K .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :2605-2607