Aluminum K edge XAFS of gibbsite and related compounds

被引：1

作者：

Bauchspiess, KR

Murata, T

Parkinson, G

Sipos, P

Watling, H

机构：

[1] CURTIN UNIV TECHNOL,SCH APPL CHEM,PERTH,WA 6001,AUSTRALIA

[2] KYOTO UNIV,DEPT PHYS,FUSHIMI KU,KYOTO 612,JAPAN

[3] MURDOCH UNIV,DEPT CHEM,MURDOCH,WA 6150,AUSTRALIA

[4] CSIRO,DIV MINERALS,WATERFORD,WA 6152,AUSTRALIA

来源：

JOURNAL DE PHYSIQUE IV | 1997年 / 7卷 / C2期

关键词：

D O I：

10.1051/jp4/1997061

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X-ray absorption spectra have been measured in total-electron yield mode at the aluminum K edge in gibbsite and related compounds. The experiments were carried out at the UVSOR storage ring in Okazaki, Japan, which is particularly suitable for these measurements because of its relatively low intensity which permits the use of a quartz monochromator without causing radiation damage to the quartz. It is shown that XAFS spectra of good quality can be obtained.

引用

页码：485 / 487

页数：3

共 7 条

[1] EXAFS BACKGROUND SUBTRACTION USING SPLINES [J].

BAUCHSPIESS, KR .

PHYSICA B, 1995, 208 (1-4) :183-184

[2] CORRELATION OF MULTIPLE-SCATTERING FEATURES IN XANES SPECTRA OF AL AND SI K-EDGES TO THE AL-O-SI BOND-ANGLE IN ALUMINOSILICATE SODALITES - AN EMPIRICAL-STUDY [J].

FROBA, M ;

WONG, J ;

BEHRENS, P ;

SIEGER, P ;

ROWEN, M ;

TANAKA, T ;

REK, Z ;

FELSCHE, J .

PHYSICA B, 1995, 208 (1-4) :65-67

[3] AL AND SI K-ABSORPTION EDGES OF AL2SIO5 POLYMORPHS USING THE NEW YB66 SOFT-X-RAY MONOCHROMATOR [J].

FROBA, M ;

WONG, J ;

ROWEN, M ;

BROWN, GE ;

TANAKA, T ;

REK, Z .

PHYSICA B, 1995, 208 (1-4) :555-556

[4] EXAFS STUDY OF THE COORDINATION ENVIRONMENT OF ALUMINUM IN A SERIES OF SILICA-RICH GLASSES AND SELECTED MINERALS WITHIN THE NA2O-AL2O3-SIO2 SYSTEM [J].

MCKEOWN, DA ;

WAYCHUNAS, GA ;

BROWN, GE .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 74 (2-3) :349-371

[5] SOFT-X-RAY BEAMLINE BL7A AT THE UVSOR [J].

MURATA, T ;

MATSUKAWA, T ;

NAOE, S ;

HORIGOME, T ;

MATSUDO, O ;

WATANABE, M .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :1309-1312

[6] HIGH-ORDER MULTIPLE-SCATTERING CALCULATIONS OF X-RAY-ABSORPTION FINE-STRUCTURE [J].

REHR, JJ ;

ALBERS, RC ;

ZABINSKY, SI .

PHYSICAL REVIEW LETTERS, 1992, 69 (23) :3397-3400

[7] NEW OPPORTUNITIES IN 1-2-KEV SPECTROSCOPY [J].

WONG, J ;

REK, ZU ;

ROWEN, M ;

TANAKA, T ;

SCHAFERS, F ;

MULLER, B ;

GEORGE, GN ;

PICKERING, IJ ;

VIA, G ;

DEVRIES, B ;

BROWN, GE ;

FROBA, M .

PHYSICA B, 1995, 208 (1-4) :220-222

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