Electron diffraction structure solution of a nanocrystalline zeolite at atomic resolution

被引：82

作者：

Wagner, P

Terasaki, O ^{[1
]}

Ritsch, S

Nery, JG

Zones, SI

Davis, ME

Hiraga, K

机构：

[1] CALTECH, Div Chem & Chem Engn, Pasadena, CA 91125 USA

[2] Tohoku Univ, Grad Sch Sci, Dept Phys, Sendai, Miyagi 9808578, Japan

[3] Tohoku Univ, Interdisciplinary Res Ctr, Sendai, Miyagi 9808578, Japan

[4] Japan Sci & Technol Corp, CREST, Kawaguchi 3320012, Japan

[5] Chevron Res & Technol Co, Richmond, CA 94802 USA

[6] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan

来源：

JOURNAL OF PHYSICAL CHEMISTRY B | 1999年 / 103卷 / 39期

关键词：

D O I：

10.1021/jp991389j

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Electron diffraction data are used to obtain the structure solution of a large-pore, high-silica zeolite, SSZ-48 that contains an occluded organic structure directing agent. The structure is determined by electron diffraction refinement and is confirmed by high-resolution transmission electron microscopy and Rietveld refinement of powder synchrotron X-ray data. The structure is found to contain a one-dimensional pore system circumscribed by 12 tetrahedral atoms (12 MR), SSZ-48 is the most complex three-dimensional material to be solved at atomic resolution using electron diffraction methods and illustrates the power of electron diffraction data for resolving the structures of materials that form crystals too small for standard single-crystal X-ray analysis.

引用

页码：8245 / 8250

页数：6

共 32 条

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