Measurement of the polarization state of light using an integrated plasmonic polarimeter

被引：143

作者：

Afshinmanesh, Farzaneh ^{[1
]}

White, Justin S. ^{[1
]}

Cai, Wenshan ^{[1
]}

Brongersma, Mark L. ^{[1
]}

机构：

[1] Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA

来源：

NANOPHOTONICS | 2012年 / 1卷 / 02期

关键词：

Surface plasmon; polarization selective devices; polarimetry;

D O I：

10.1515/nanoph-2012-0004

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Plasmonics has started to facilitate the replacement of bulky optical components in optical systems by compact nanometallic elements that perform the same function. This allows for a natural and very dense integration with electronic devices. In this vein, we present a silicon (Si) photodetector integrated with a set of plasmonic structures that can be used as either a broadband linear-Stokes polarimeter or a narrowband full-Stokes polarimeter capable of determining the complete state of polarization of a light beam. At a probe-wavelength of 830 nm, our experimental results show contrast ratios of 25 and 1.13 for orthogonal linear and circular states of polarization, in good agreement with simulations. The resulting device is lightweight, orders of magnitude smaller than conventional polarimeters, and mechanically robust. For these reasons, there promises to be a wide range of applications including polarimetric imaging and sensing.

引用

页码：125 / 129

页数：5

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