Correlation between the residual resistance ratio and magnetoresistance in MgB2 -: art. no. 024502

被引:50
作者
Chen, XH [1 ]
Wang, YS
Xue, YY
Meng, RL
Wang, YQ
Chu, CW
机构
[1] Univ Houston, Dept Phys, Houston, TX 77204 USA
[2] Univ Houston, Texas Ctr Superconduct, Houston, TX 77204 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA
[4] Hong Kong Univ Sci & Technol, Hong Kong, Hong Kong, Peoples R China
关键词
D O I
10.1103/PhysRevB.65.024502
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The resistivity and magnetoresistance in the normal state for bulk and thin-film MgB2 with different nominal compositions have been studied systematically. These samples show different temperature dependences of normal-state resistivity and residual resistance ratios although their superconducting transition temperatures are nearly the same, except for the thin-film sample. The correlation between the residual resistance ratio (RRR) and the power-law dependence of the low-temperature resistivity, rho vs T-c, indicates that the electron-phonon interaction is important. It is found that the magnetoresistance (MR) in the normal state scales well with the RRR, a(0) (MR) proportional to (RRR) (2.2+/-0.1) at 50 K. This accounts for the large difference in magnetoresistance reported by various groups, due to different defect scatterings in the samples.
引用
收藏
页码:245021 / 245025
页数:5
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