Field emission of copper nanowires grown in polymer ion-track membranes

被引：37

作者：

Maurer, F

Dangwal, A

Lysenkov, D

Müller, G

Toimil-Molares, ME

Trautmann, C

Brötz, J

Fuess, H

机构：

[1] Tech Univ Darmstadt, Dept Mat & Earth Sci, D-64287 Darmstadt, Germany

[2] Univ Gesamthsch Wuppertal, FB C Phys, D-42097 Wuppertal, Germany

[3] GSI, D-64291 Darmstadt, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2006年 / 245卷 / 01期

关键词：

field emission; copper; nanowires; heavy-ion irradiation; ion-track etch technique; polymeric membrane; field emission scanning microscopy;

D O I：

10.1016/j.nimb.2005.11.124

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Field emission properties of randomly distributed copper nanowires are presented. The wires were potentiostatically deposited into the pores of polycarbonate membranes produced by the ion-track etch technique. The diameter and length of the vertically aligned wires with number densities between 10(6) and 10(8) wires/cm(2) were in the range of 210-330 nm and 8-18 mu m, respectively. By means of field emission scanning microscopy, emission site densities between 0.4 x 10(5) cm(-2) and 1.4 x 10(5) cm(-2) were obtained for nA currents at 6 V/mu m. Two-thirds of the nanowire emitters showed Fowler-Nordheim behaviour with an average field enhancement factor of beta = 245, which is about three times higher than expected for a cylindrical wire geometry with a half-sphere tip. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：337 / 341

页数：5

共 29 条

[1] Electron field emission from silicon nanowires [J].