Conduction-band-edge variations of pseudomorphic Si1-x-yGexCy alloys on (110) Si and Ge substrates

被引:1
作者
Wu, LQ
Huang, MC
Li, SP
Zhu, ZZ
Zhuang, BH
机构
[1] CCAST, World Lab, Beijing 100080, Peoples R China
[2] Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China
基金
中国国家自然科学基金;
关键词
semiconductors; thin films; electronic band structure;
D O I
10.1016/S0038-1098(99)00242-2
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The trends of the conduction band minima with the alloy compositions for the pseudomorphic Si1-x-yGexCy alloys grown on (110) Si and Ge substrates are investigated theoretically with the use of the ab initio pseudopotential method and the virtual-crystal approximation. It is found that the minimum energy gaps are all indirect and not monotonically dependent on the compositions in some cases. In the case of the tensile and compressive strains, the minimum energy gap decreases and increases, respectively, as the C fraction increases and the Ge fraction is constant. Our result is in good agreement with other theoretical results for the Si1-xGex system. (C) 1999 Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:577 / 581
页数:5
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