Diffraction-suppressed high-resolution imaging through metallodielectric nanofilms

被引：41

作者：

Feng, SM ^{[1
]}

Elson, JM ^{[1
]}

机构：

[1] USN, Dept Res, Warfare Ctr, China Lake, CA 93555 USA

来源：

OPTICS EXPRESS | 2006年 / 14卷 / 01期

关键词：

D O I：

10.1364/OPEX.14.000216

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We show that diffraction-suppressed propagation of light can be achieved in one-dimensional multilayer metal-dielectric structure, leading to high-resolution imaging through metallodielectric nanofilms.

引用

页码：216 / 221

页数：6

共 19 条

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